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February 2011 (vol. 44 no. 2)
pp. 74-76
Bob Ward, IEEE Computer Society
Former IEEE Computer Society Board of Governors member Thomas W. Williams recently received the IEEE Computer Society Test Technology Technical Council’s Lifetime Contribution Award.
Index Terms:
test, TTTC, awards, medal of honor, scan-based test, Thomas W. Williams
Citation:
Bob Ward, "Tom Williams Wins TTTC Award," Computer, vol. 44, no. 2, pp. 74-76, Feb. 2011, doi:10.1109/MC.2011.58
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