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Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge
February 2011 (vol. 44 no. 2)
pp. 46-53
Wenjing Rao, University of Illinois at Chicago, Chicago
Chengmo Yang, University of Delaware, Newark
Ramesh Karri, Polytechnic University, Brooklyn
Alex Orailoglu, University of California at San Diego, La Jolla
Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

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Index Terms:
Nanoscale systems, Reliability
Citation:
Wenjing Rao, Chengmo Yang, Ramesh Karri, Alex Orailoglu, "Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge," Computer, vol. 44, no. 2, pp. 46-53, Feb. 2011, doi:10.1109/MC.2011.1
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