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Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge
February 2011 (vol. 44 no. 2)
pp. 46-53
ASCII Text
x 
 
Wenjing Rao, Chengmo Yang, Ramesh Karri, Alex Orailoglu, "Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge," Computer, vol. 44, no. 2, pp. 46-53, February, 2011.
 
 
BibTex
x
 
@article{ 10.1109/MC.2011.1,
author = {Wenjing Rao and Chengmo Yang and Ramesh Karri and Alex Orailoglu},
title = {Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge},
journal ={Computer},
volume = {44},
number = {2},
issn = {0018-9162},
year = {2011},
pages = {46-53},
doi = {http://doi.ieeecomputersociety.org/10.1109/MC.2011.1},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - Computer
TI - Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge
IS - 2
SN - 0018-9162
SP46
EP53
EPD - 46-53
A1 - Wenjing Rao,
A1 - Chengmo Yang,
A1 - Ramesh Karri,
A1 - Alex Orailoglu,
PY - 2011
KW - Nanoscale systems
KW - Reliability
VL - 44
JA - Computer
ER -
 
Wenjing Rao, University of Illinois at Chicago, Chicago
Chengmo Yang, University of Delaware, Newark
Ramesh Karri, Polytechnic University, Brooklyn
Alex Orailoglu, University of California at San Diego, La Jolla
Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

1. R.I. Bahar et al., "Architectures for Silicon Nanoelectronics and Beyond," Computer, Jan. 2007, pp. 25-33.
2. C.J.M. Lasance, "Thermally Driven Reliability Issues in Microelectronic Systems: Status-Quo and Challenges," Microelectronic Reliability, Dec. 2003, pp. 1969-1974.
3. M. Forshaw et al., "A Short Review of Nanoelectronic Architectures," Nanotechnology, Apr. 2004, pp. 220-223.
4. J. Han et al., "Towards Hardware-Redundant, Fault-Tolerant Logic for Nanoelectronics," IEEE Design & Test of Computers, July/Aug. 2005, pp. 328-339.
5. A. De Hon, "Nanowire-Based Programmable Architectures," ACM J. Emerging Technologies in Computing Systems, July 2005, pp. 109-162.
6. W. Rao, A. Orailoglu, and R. Karri, "Logic Mapping in Crossbar-Based Nanoarchitectures," IEEE Design & Test of Computers, Jan./Feb. 2009, pp. 68-77.
7. C. Yang and A. Orailoglu, "Frugal but Flexible Multicore Topologies in Support of Resource Variation-Driven Adaptivity," to appear in Proc. Conf. Design, Automation, and Test in Europe (DATE 11), European Design and Automation Assoc., 2011.

Index Terms:
Nanoscale systems, Reliability
Citation:
Wenjing Rao, Chengmo Yang, Ramesh Karri, Alex Orailoglu, "Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge," Computer, vol. 44, no. 2, pp. 46-53, Feb. 2011, doi:10.1109/MC.2011.1
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