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Issue No.02 - February (2011 vol.44)
pp: 46-53
Chengmo Yang , University of Delaware, Newark
Ramesh Karri , Polytechnic University, Brooklyn
Wenjing Rao , University of Illinois at Chicago, Chicago
ABSTRACT
Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.
INDEX TERMS
Nanoscale systems, Reliability
CITATION
Chengmo Yang, Ramesh Karri, Wenjing Rao, "Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge", Computer, vol.44, no. 2, pp. 46-53, February 2011, doi:10.1109/MC.2011.1
REFERENCES
1. R.I. Bahar et al., "Architectures for Silicon Nanoelectronics and Beyond," Computer, Jan. 2007, pp. 25-33.
2. C.J.M. Lasance, "Thermally Driven Reliability Issues in Microelectronic Systems: Status-Quo and Challenges," Microelectronic Reliability, Dec. 2003, pp. 1969-1974.
3. M. Forshaw et al., "A Short Review of Nanoelectronic Architectures," Nanotechnology, Apr. 2004, pp. 220-223.
4. J. Han et al., "Towards Hardware-Redundant, Fault-Tolerant Logic for Nanoelectronics," IEEE Design & Test of Computers, July/Aug. 2005, pp. 328-339.
5. A. De Hon, "Nanowire-Based Programmable Architectures," ACM J. Emerging Technologies in Computing Systems, July 2005, pp. 109-162.
6. W. Rao, A. Orailoglu, and R. Karri, "Logic Mapping in Crossbar-Based Nanoarchitectures," IEEE Design & Test of Computers, Jan./Feb. 2009, pp. 68-77.
7. C. Yang and A. Orailoglu, "Frugal but Flexible Multicore Topologies in Support of Resource Variation-Driven Adaptivity," to appear in Proc. Conf. Design, Automation, and Test in Europe (DATE 11), European Design and Automation Assoc., 2011.
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