Issue No.02 - February (2011 vol.44)
pp: 46-53
Chengmo Yang , University of Delaware, Newark
Ramesh Karri , Polytechnic University, Brooklyn
Wenjing Rao , University of Illinois at Chicago, Chicago
Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.
Nanoscale systems, Reliability
Chengmo Yang, Ramesh Karri, Wenjing Rao, "Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge", Computer, vol.44, no. 2, pp. 46-53, February 2011, doi:10.1109/MC.2011.1
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