Issue No.02 - February (2005 vol.38)
Yervant Zorian , Virage Logic Corp.
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MC.2005.67
The silicon-scaling revolution presents a plethora of challenges as technology progresses into the nanoscale era. To meet these challenges, the design and test community has banded together to improve design automation and find solutions that will optimize performance at every level.
design and test, nanotechnology, design automation
Yervant Zorian, "Nanoscale Design & Test Challenges", Computer, vol.38, no. 2, pp. 36-39, February 2005, doi:10.1109/MC.2005.67