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Issue No.11 - November (1999 vol.32)
pp: 42-45
ABSTRACT
<p>Test engineers are already hard pressed to ensure the quality of ICs despite ever-shorter time to market and skyrocketing test costs. Nanometer technologies will only add to the challenge.</p>
CITATION
Rohit Kapur, Thomas W. Williams, "Guest Editors' Introduction: Tough Challenges as Design and Test Go Nanometer", Computer, vol.32, no. 11, pp. 42-45, November 1999, doi:10.1109/2.803639
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