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November 1999 (vol. 32 no. 11)
pp. 42-45
| ASCII Text | x | ||
| Rohit Kapur, Thomas W. Williams, "Guest Editors' Introduction: Tough Challenges as Design and Test Go Nanometer," Computer, vol. 32, no. 11, pp. 42-45, November, 1999. | |||
| BibTex | x | ||
| @article{ 10.1109/2.803639, author = {Rohit Kapur and Thomas W. Williams}, title = {Guest Editors' Introduction: Tough Challenges as Design and Test Go Nanometer}, journal ={Computer}, volume = {32}, number = {11}, issn = {0018-9162}, year = {1999}, pages = {42-45}, doi = {http://doi.ieeecomputersociety.org/10.1109/2.803639}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - Computer TI - Guest Editors' Introduction: Tough Challenges as Design and Test Go Nanometer IS - 11 SN - 0018-9162 SP42 EP45 EPD - 42-45 A1 - Rohit Kapur, A1 - Thomas W. Williams, PY - 1999 VL - 32 JA - Computer ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/2.803639
Test engineers are already hard pressed to ensure the quality of ICs despite ever-shorter time to market and skyrocketing test costs. Nanometer technologies will only add to the challenge.
Citation:
Rohit Kapur, Thomas W. Williams, "Guest Editors' Introduction: Tough Challenges as Design and Test Go Nanometer," Computer, vol. 32, no. 11, pp. 42-45, Nov. 1999, doi:10.1109/2.803639
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