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Test engineers are already hard pressed to ensure the quality of ICs despite ever-shorter time to market and skyrocketing test costs. Nanometer technologies will only add to the challenge.

Citation:
Rohit Kapur, Thomas W. Williams, "Guest Editors' Introduction: Tough Challenges as Design and Test Go Nanometer," Computer, vol. 32, no. 11, pp. 42-45, Nov. 1999, doi:10.1109/2.803639
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