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1999
Issue No. 11 - November
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Bibliographic References
ASCII Text
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RefWorks Procite/RefMan/EndNote
Computer
November 1999 (vol. 32 no. 11)
ISSN: 0018-9162
Table of Contents
Component and Object Technology
Every little bit counts: toward more reliable software
(Abstract)
B. Mayer
, Interactive Soltware Engineerlng, ISE Bldg., 2nd FI., 270 Stork,Rd., Goleta, CA93117
pp. 131,132,133,134,135
ABSTRACT
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Letters
Letters
(Abstract)
pp. 9
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Industry News
Storage Technology Takes Center Stage
(Abstract)
George Lawton
pp. 10-12,16
ABSTRACT
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Technology News
Vendors Are Counting on Appliance-on-Chip Technology
(Abstract)
Lee H. Goldberg
pp. 13-16
ABSTRACT
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News Briefs
News Briefs
(Abstract)
pp. 17-18
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Y2K in Brief
US Issues Y2K Travel Forecast
(Abstract)
pp. 19
ABSTRACT
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Rubin's Y2K Diary
A Crisis of Arrogance
(Abstract)
pp. 20-21
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Article Summaries
Article Summaries
(Abstract)
pp. 22-23
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Cybersquare
Rethinking Deep-Submicron Circuit Design
(Abstract)
Dennis Sylvester
Kurt Keutzer
pp. 25-33
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Feature
Just Curious: An Interview with John Cocke
(Abstract)
Bruce Shriver
Peter Capek
pp. 34-41
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Cover Feature
Guest Editors' Introduction: Tough Challenges as Design and Test Go Nanometer
(HTML)
Rohit Kapur
Thomas W. Williams
pp. 42-45
ABSTRACT
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Nanometer Technology Effects on Fault Models for IC Testing
(Abstract)
Robert C. Aitken
pp. 46-51
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Nanometer Technology Challenges for Test and Test Equipment
(Abstract)
Wayne M. Needham
pp. 52-57
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Current Directions in Automatic Test-Pattern Generation
(Abstract)
Kwang-Ting Cheng
Angela Krstic
pp. 58-64
ABSTRACT
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Robust Scan-Based Logic Test in VDSM Technologies
(Abstract)
Kenneth D. Wagner
pp. 66-74
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Membership News
Your Call
(Abstract)
pp. 75
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Computer Society Connection
(Abstract)
pp. 76-78
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Technical Activities Forum
Hot Topics in Electronic Design Automation
(Abstract)
Charles Rosenthal
Joseph Damore
pp. 79-80
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Calendar and Call
Call and Calendar
(Abstract)
pp. 80-82
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New Books
New Books
(Abstract)
pp. 119
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New Tools
New Tools
(Abstract)
pp. 120-122
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Internet Watch
Today's Style Sheet Standards: The Great Vision Blinded
(Abstract)
Philip M. Marden
Ethan V. Munson
pp. 123-125
ABSTRACT
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Standards
IEEE 802.11: Wireless Is Coming Home
(Abstract)
Charles Severance
pp. 126-127
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Management
A Tale of Three Developers
(Abstract)
Donald J. Reifer
pp. 128-130
ABSTRACT
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Binary Critic
Where the Smart Money Is?
(Abstract)
Ted Lewis
pp. 136,134-135
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