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Design Techniques for Testable Embedded Error Checkers
July 1990 (vol. 23 no. 7)
pp. 84-88

Design techniques to ensure the testability of embedded checkers that cannot be tested by scan-path bistables are presented. The discussion covers: types of error detectors; parity checkers and self-testing circuits; two-rail checkers; M-out-of-N checkers; and equality checkers. The techniques outline guarantee single stuck fault testability.

Citation:
E.J. McCluskey, "Design Techniques for Testable Embedded Error Checkers," Computer, vol. 23, no. 7, pp. 84-88, July 1990, doi:10.1109/2.56855
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