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Issue No.07 - July (1990 vol.23)
pp: 84-88
ABSTRACT
<p>Design techniques to ensure the testability of embedded checkers that cannot be tested by scan-path bistables are presented. The discussion covers: types of error detectors; parity checkers and self-testing circuits; two-rail checkers; M-out-of-N checkers; and equality checkers. The techniques outline guarantee single stuck fault testability.</p>
CITATION
E.J. McCluskey, "Design Techniques for Testable Embedded Error Checkers", Computer, vol.23, no. 7, pp. 84-88, July 1990, doi:10.1109/2.56855
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