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Issue No.04 - April (1989 vol.22)
pp: 43-49
ABSTRACT
<p>A description is given of Gentest, with emphasis on STG2, a sequential test generator that uses the Back test-generation algorithm and the Split value model. The performance of STG2 on a Convex C-1 computer is compared with that of its predecessor, STG1 and STG1.5. Results are also presented for another set of experiments for Gentest on a Sun 3/60 workstation.</p>
CITATION
Wu-Tung Cheng, Tapan J. Chakraborty, "Gentest: An Automatic Test-Generation System for Sequential Circuits", Computer, vol.22, no. 4, pp. 43-49, April 1989, doi:10.1109/2.25381
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