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Issue No.04 - April (1989 vol.22)
pp: 16-24
ABSTRACT
<p>The authors survey high-level approaches to test generation for VLSI circuits, which can significantly reduce test generation time while still providing good fault coverage. High-level approaches view the circuit with less structural detail, that is, from a more abstract viewpoint and often hierarchically. The authors first review some basic circuit and fault models and the two most widely known test-generation algorithms as a basis for comparison between high-level and low-level techniques. The authors then examine the more important high-level approaches, which fall into two broad classes, namely algorithmic and heuristic.</p>
CITATION
Debashis Bhattacharya, Brian T. Murray, John P. Hayes, "High-Level Test Generation for VLSI", Computer, vol.22, no. 4, pp. 16-24, April 1989, doi:10.1109/2.25379
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