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| ASCII Text | x | ||
| D. Siewiorek, D. Rennels, "Workshop Report: Fault-Tolerant VLSI Design," Computer, vol. 13, no. 12, pp. 51-53, December, 1980. | |||
| BibTex | x | ||
| @article{ 10.1109/MC.1980.1653458, author = {D. Siewiorek and D. Rennels}, title = {Workshop Report: Fault-Tolerant VLSI Design}, journal ={Computer}, volume = {13}, number = {12}, issn = {0018-9162}, year = {1980}, pages = {51-53}, doi = {http://doi.ieeecomputersociety.org/10.1109/MC.1980.1653458}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - Computer TI - Workshop Report: Fault-Tolerant VLSI Design IS - 12 SN - 0018-9162 SP51 EP53 EPD - 51-53 A1 - D. Siewiorek, A1 - D. Rennels, PY - 1980 KW - null VL - 13 JA - Computer ER - | |||
Contemporary integrated circuits contain as many components as the largest computing systems of 15 to 20 years ago. The age of VLSI is here, and its technology is presenting interesting potentials as well as challenges. The increased component count provides the opportunity for increased functionality and/or overhead such as built-in-test circuits or structured, top-down design methodologies. At the same time, shrinking device dimensions increase system susceptibility to small energy perturbations. For example, alpha particles from trace elements in packaging material have been observed causing "soft" errors in dynamic MOS RAM chips.
Citation:
D. Siewiorek, D. Rennels, "Workshop Report: Fault-Tolerant VLSI Design," Computer, vol. 13, no. 12, pp. 51-53, Dec. 1980, doi:10.1109/MC.1980.1653458
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