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Issue No.03 - March (1980 vol.13)
pp: 17-26
J.P. Hayes , University of Southern California
ABSTRACT
Microprocessors are difficult to test?many failure modes exist and access to internal components is limited. Design techniques that enhance testability can reduce the impact of these constraints.
INDEX TERMS
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CITATION
J.P. Hayes, "Testability Considerotions in Microprocessor-Based Design", Computer, vol.13, no. 3, pp. 17-26, March 1980, doi:10.1109/MC.1980.1653526
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