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March 1980 (vol. 13 no. 3)
pp. 17-26
| ASCII Text | x | ||
| J.P. Hayes, E.J. McCluskey, "Testability Considerotions in Microprocessor-Based Design," Computer, vol. 13, no. 3, pp. 17-26, March, 1980. | |||
| BibTex | x | ||
| @article{ 10.1109/MC.1980.1653526, author = {J.P. Hayes and E.J. McCluskey}, title = {Testability Considerotions in Microprocessor-Based Design}, journal ={Computer}, volume = {13}, number = {3}, issn = {0018-9162}, year = {1980}, pages = {17-26}, doi = {http://doi.ieeecomputersociety.org/10.1109/MC.1980.1653526}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - Computer TI - Testability Considerotions in Microprocessor-Based Design IS - 3 SN - 0018-9162 SP17 EP26 EPD - 17-26 A1 - J.P. Hayes, A1 - E.J. McCluskey, PY - 1980 KW - null VL - 13 JA - Computer ER - | |||
Microprocessors are difficult to test?many failure modes exist and access to internal components is limited. Design techniques that enhance testability can reduce the impact of these constraints.
Citation:
J.P. Hayes, E.J. McCluskey, "Testability Considerotions in Microprocessor-Based Design," Computer, vol. 13, no. 3, pp. 17-26, March 1980, doi:10.1109/MC.1980.1653526
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