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March 1980 (vol. 13 no. 3)
pp. 9-15
S.B. Akers, General Electric Company
Existing test generation procedures are rooted in the SSI/MSI era. New techniques will cope with today's vastly more complicated LSI/VLSI systems.
Citation:
S.B. Akers, "Test Generation Techniques," Computer, vol. 13, no. 3, pp. 9-15, March 1980, doi:10.1109/MC.1980.1653524
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