This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
October 1979 (vol. 12 no. 10)
pp. 40-47
W.A. Plice, Honeywell Incorporated
The bewildering changes currently facing designers and users of analog test equipment are leading to new techniques and improved hardware that should reduce test time by a factor of four within the next decade.
Citation:
W.A. Plice, "Automatic Analog Testing - 1979 Style," Computer, vol. 12, no. 10, pp. 40-47, Oct. 1979, doi:10.1109/MC.1979.1658496
Usage of this product signifies your acceptance of the Terms of Use.