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Issue No.10 - October (1979 vol.12)
pp: 32-38
E. Foley , Teradyne, Inc.
ABSTRACT
Increasing device complexity has brought increased responsibility both for test engineers and design engineers: design engineers must create testable designs; test engineers must report testability problems back to the designers.
INDEX TERMS
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CITATION
E. Foley, "The Effects of the Microelectronics Revolution on Systems and Board Test", Computer, vol.12, no. 10, pp. 32-38, October 1979, doi:10.1109/MC.1979.1658494
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