This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
October 1979 (vol. 12 no. 10)
pp. 7-8
The testing of digital systems has grown increasingly complex. LSI circuits, commonplace in today's systems, require thorough testing at the component level. VLSI adds even more complexity. How are these challenges being met? This special issue surveys the state-of-the-art and attempts to answer the question.
Citation:
K.R. Anderson, H.A. Perkins, "Hardware Test Technology," Computer, vol. 12, no. 10, pp. 7-8, Oct. 1979, doi:10.1109/MC.1979.1658489
Usage of this product signifies your acceptance of the Terms of Use.