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Issue No.10 - October (1979 vol.12)
pp: 7-8
ABSTRACT
The testing of digital systems has grown increasingly complex. LSI circuits, commonplace in today's systems, require thorough testing at the component level. VLSI adds even more complexity. How are these challenges being met? This special issue surveys the state-of-the-art and attempts to answer the question.
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CITATION
K.R. Anderson, H.A. Perkins, "Hardware Test Technology", Computer, vol.12, no. 10, pp. 7-8, October 1979, doi:10.1109/MC.1979.1658489
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