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| "New Literature," Computer, vol. 12, no. 6, pp. 84, June, 1979. | |||
| BibTex | x | ||
| @article{ 10.1109/MC.1979.1658785, author = {}, title = {New Literature}, journal ={Computer}, volume = {12}, number = {6}, issn = {0018-9162}, year = {1979}, pages = {84}, doi = {http://doi.ieeecomputersociety.org/10.1109/MC.1979.1658785}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - Computer TI - New Literature IS - 6 SN - 0018-9162 SP EP EPD - 84 PY - 1979 KW - null VL - 12 JA - Computer ER - | |||
Linear test system. Teradyne's J273B tests and laser trims a wide variety of linear devices and modules. A brochure describing the system, its options, and applications packages is available from the Publications Dept., Teradyne, Inc., 183 Essex St., Boston, MA 02111.
Citation:
"New Literature," Computer, vol. 12, no. 6, pp. 84, June 1979, doi:10.1109/MC.1979.1658785
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