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October 1978 (vol. 11 no. 10)
pp. 6-17
CMOS ICsare being produced using a variety of processes, and considerable data is now available on their reliability and failure mechanisms.
Citation:
G.L. Schnable, L.J. Gallace, H.L. Pujol, "Reliability of CMOS Integrated Circuits," Computer, vol. 11, no. 10, pp. 6-17, Oct. 1978, doi:10.1109/C-M.1978.217937
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