|
| This Article | ||
| | ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
| ||
October 1976 (vol. 9 no. 10)
pp. 43-50
| ASCII Text | x | ||
| L. Levine, W. Meyers, "Special Feature: Semiconductor Memory Reliability with Error Detecting and Correcting Codes," Computer, vol. 9, no. 10, pp. 43-50, October, 1976. | |||
| BibTex | x | ||
| @article{ 10.1109/C-M.1976.218410, author = {L. Levine and W. Meyers}, title = {Special Feature: Semiconductor Memory Reliability with Error Detecting and Correcting Codes}, journal ={Computer}, volume = {9}, number = {10}, issn = {0018-9162}, year = {1976}, pages = {43-50}, doi = {http://doi.ieeecomputersociety.org/10.1109/C-M.1976.218410}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - Computer TI - Special Feature: Semiconductor Memory Reliability with Error Detecting and Correcting Codes IS - 10 SN - 0018-9162 SP43 EP50 EPD - 43-50 A1 - L. Levine, A1 - W. Meyers, PY - 1976 KW - null VL - 9 JA - Computer ER - | |||
Although continuing cost and performance improvements of the new bipolar and MOS RAM devices are providing strong incentives for their greatly expanded use in mainframe memory and other storage applications, these components have not yet reached the degree of reliability required for large memory systems. Fortunately, however, memory system organization is compatible with a wide variety of low-cost fault detection and correction techniques6,10,11 that go a long way toward compensating for otherwise error-prone systems.
Citation:
L. Levine, W. Meyers, "Special Feature: Semiconductor Memory Reliability with Error Detecting and Correcting Codes," Computer, vol. 9, no. 10, pp. 43-50, Oct. 1976, doi:10.1109/C-M.1976.218410
Usage of this product signifies your acceptance of the Terms of Use.