This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
October 1975 (vol. 8 no. 10)
pp. 60-67
T.A. Laliotis, Fairchild Camera and Instrument Corporation
The objective of this paper is to bring forth the benefits that can be realized by using LSI microprocessors in test equipment and instrument applications. We will attempt to do this by describing the Qualifier* 901, which is a low-cost bench top digital integrated circuit tester controlled by an LSI microprocessor. First, we identify the scope of low-cost testers and describe the general principles of operation of such testers using fixed logic control. Then we describe the Qualifier 901, and finally, we point out the advantages gained by the usage of the intelligence of the microprocessor in Qualifier 901 versus fixed logic controlled testers.
Citation:
T.A. Laliotis, T.D. Brumett, "A Microprocessors-Controlled DIC Test System*," Computer, vol. 8, no. 10, pp. 60-67, Oct. 1975, doi:10.1109/C-M.1975.218781
Usage of this product signifies your acceptance of the Terms of Use.