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| E. G. Ulrich, T. Baker, "Concurrent simulation of nearly identical digital networks," Computer, vol. 7, no. 4, pp. 39-44, April, 1974. | |||
| BibTex | x | ||
| @article{ 10.1109/MC.1974.6323496, author = {E. G. Ulrich and T. Baker}, title = {Concurrent simulation of nearly identical digital networks}, journal ={Computer}, volume = {7}, number = {4}, issn = {0018-9162}, year = {1974}, pages = {39-44}, doi = {http://doi.ieeecomputersociety.org/10.1109/MC.1974.6323496}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - Computer TI - Concurrent simulation of nearly identical digital networks IS - 4 SN - 0018-9162 SP39 EP44 EPD - 39-44 A1 - E. G. Ulrich, A1 - T. Baker, PY - 1974 VL - 7 JA - Computer ER - | |||
Test patterns for testing digital circuits are usually checked on a test verification program to determine if all or most of the possible faults will be detected. Historically, such a test verification program would be accomplished with many simulations: one for each possible fault.
Citation:
E. G. Ulrich, T. Baker, "Concurrent simulation of nearly identical digital networks," Computer, vol. 7, no. 4, pp. 39-44, April 1974, doi:10.1109/MC.1974.6323496
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